1.

Conference Proceedings
Conference Proceedings
1. n+/p Diodes Realized in SiC by Phosphorus Ion Implantation: Electrical Characterization as a Function of Temperature
Canino, M. ; Castaldini, A. ; Cavallini, A. ; Moscatelli, F. ; Nipoti, R. ; Poggi, A.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.649-652,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
2.

Conference Proceedings
Conference Proceedings
2. Dislocation-Related Deep States Induced by Irradiation in HVPE n-GaN
Castaldini, A. ; Cavallini, A. ; Polenta, L.
Pub. info.: GaN and related alloys - 2002 : symposium held December 2-6, Boston, Massachusetts, U.S.A..  pp.743-748,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 743
3.

Conference Proceedings
Conference Proceedings
3. Defect Influence on the Electrical Properties of 4H-SiC Schottky Diodes
Scaltrito, L. ; Celasco, E. ; Porro, S. ; Ferrero, S. ; Giorgis, F. ; Pirri, C.F. ; Perrone, D. ; Meotto, U. ; Mandracci, P. ; Richieri, G. ; Merlin, L. ; Cavallini, A. ; Castaldini, A. ; Rossi, M.
Pub. info.: Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003.  pp.1081-1084,  2004.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 457-460
4.

Conference Proceedings
Conference Proceedings
4. Silicon Carbide for Alpha, Beta, Ion and Soft X-Ray High Performance Detectors
Bertuccio, G. ; Binetti, S. ; Caccia, S. ; Casiraghi, R. ; Castaldini, A. ; Cavallini, A. ; Lanzieri, C. ; Donne, A. Le ; Nava, F. ; Pizzini, S. ; Rigutti, L. ; Verzellesi, G. ; Vittone, E.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.1015-1020,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
5.

Conference Proceedings
Conference Proceedings
5. Characterisation of Bulk and Surface Properties in Semiconductors Using Non-Contacting Techniques
Castaldini, A. ; Cavakoli, D. ; Cavallini, A. ; Rossi, M.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.346-356,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-3
6.

Conference Proceedings
Conference Proceedings
6. Characterization of Electrical Contacts on Polycrystalline 3C-SiC Thin Films
Castaldini, A. ; Cavallini, A. ; Rossi, M. ; Cocuzza, M. ; Ricciardi, C.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.745-748,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
7.

Conference Proceedings
Conference Proceedings
7. Electrical and Optical Characterization of Electron Irradiated X Rays Detectors Based on 4H-SiC Epitaxial Layers
Le Donne, A. ; Binetti, S. ; Acciarri, M. ; Castaldini, A. ; Nava, F. ; Cavallini, A. ; Pizzini, S.
Pub. info.: Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003.  pp.1503-1506,  2004.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 457-460
8.

Conference Proceedings
Conference Proceedings
8. Correlation between Defects and Electrical Properties of 4H-SiC Based Schottky Diodes
Scaltrito, L. ; Porro, S. ; Giorgis, F. ; Mandracci, P. ; Cocuzza, M. ; Pirri, C.F. ; Ricciardi, C. ; Ferrero, S. ; Richieri, G. ; Sgorlon, C. ; Merlin, L. ; Cavallini, A. ; Castaldini, A.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.455-458,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436
9.

Conference Proceedings
Conference Proceedings
9. Electron-Induced Damage Effects in 4H-SiC Schottky Diodes
Castaldini, A. ; Cavallini, A. ; Nava, F. ; Fuochi, P.G. ; Vanni, P.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.439-442,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436
10.

Conference Proceedings
Conference Proceedings
10. Charged Particle Detection Properties of Epitaxial 4H-SiC Schottky Diodes
Nava, F. ; Vanni, P. ; Verzellesi, G. ; Castaldini, A. ; Cavallini, A. ; Polenta, L. ; Nipoti, R. ; Donolato, C.
Pub. info.: Silicon carbide and related materials : ECSCRM2000, proceedings of the 3rd European Conference on Silicon Carbide and Related Materials, Kloster Banz, Germany, September 2000.  pp.757-762,  2001.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 353-356