1.

Conference Proceedings

Conference Proceedings
Wilkening,W. ; Kaufmann,U. ; Schneider,J. ; Schonherr,E. ; Glaser,E.R. ; Shanabrook,B.V. ; Waterman,J.R. ; Wagner,R.J.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.793-798,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
2.

Conference Proceedings

Conference Proceedings
Kunzer,M. ; Kaufmann,U. ; Maier,K. ; Schneider,J. ; Herres,N. ; Akasaki,I. ; Amano,H.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.87-92,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings

Conference Proceedings
Baeumler,M. ; Meyer,B.K. ; Kaufmann,U. ; Schneider,J.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.797-802,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
4.

Conference Proceedings

Conference Proceedings
Maier,K. ; Kunzer,M. ; Kaufmann,U. ; Schneider,J. ; Monemar,B. ; Akasaki,I. ; Amano,H.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.93-98,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147