1.

Conference Proceedings
Conference Proceedings
1. Transition-metal acceptor pairs in silicon
Emanuelsson,P. ; Omling,P. ; Grimmeiss,H.G. ; Cehlhoff,W. ; Kreissl,J. ; Irmscher,K. ; Rehse,U.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.137-142,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
2.

Conference Proceedings
Conference Proceedings
2. The Identification of Intrinsic Vacancy Defects in CdTe
Meyer,B.K. ; Omling,P. ; Emanuelsson,P.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.397-398,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings
Conference Proceedings
3. Photoluminescence and Optically Detected Magnetic Resonance Investigations on the Indium A-Center in CdTe:In
Stadler,W. ; Meyer,B.K. ; Hofmann,D.M. ; Kowalski,B. ; Emanuelsson,P. ; Omling,P. ; Weigl,E. ; Miiller-Vogt,G. ; Cox,R.T.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.399-404,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
4.

Conference Proceedings
Conference Proceedings
4. The Influence of Process-Indueed Surface Defects on Luminescence and Transport Properties of Low-Dimensional Structures
Emanueisson,P. ; Maximov,I. ; Linke,H. ; Omling,P. ; Samuelson,L. ; Meyer,B.K.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1541-1546,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
5.

Conference Proceedings
Conference Proceedings
5. Excitation Spectrum of the Interstitial Iron Donor in Silicon
Olajos,J. ; Nielsen,B.Bech ; Kleverman,M. ; Omling,P. ; Emanuelsson,O. ; Grimmeiss,H.G.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part1  pp.397-402,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
6.

Conference Proceedings
Conference Proceedings
6. Electron Paramagnetic Resonance Studies of Defects in Indium-Doped Silicon
Omling,P. ; Emanuelsson,P. ; Grimmeiss,H.G.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part1  pp.445-450,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
7.

Conference Proceedings
Conference Proceedings
7. Optical and spin dependent investigations of Mn2++ and V3+ in GaP
Omling,P. ; Meyer,B.K.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.713-718,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
8.

Conference Proceedings
Conference Proceedings
8. The Temperature Dependence of the Hole Ionization Cross Section of EL2 in GaAs
Omling,P. ; Silverberg,P. ; Samuelson,L.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part1  pp.79-84,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41