1.

Conference Proceedings
Conference Proceedings
1. Deep Level near Ec - 0.55 eV in Undoped 4H-SiC Substrates
Mitchel, W.C. ; Mitchell, W.D. ; Smith, S.R. ; Landis, G. ; Evwaraye, A.O. ; Fang, Z.Q. ; Look, D.C. ; Sizelove, J.R.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.505-508,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
2.

Conference Proceedings
Conference Proceedings
2. Deep Traps in High-Ptlrity Semi-Insulating 6H-SiC Substrates: Thermally Stimulated Current Spectroscopy
Fang, Z.Q. ; Claflin, B. ; Look, D.C. ; Polenta, L. ; Chen, J. ; Anderson, T. ; Mitchel, W.C.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.509-512,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529