1.

Conference Proceedings

Conference Proceedings
Faifer, V. ; Edelman, P. ; Kontkiewicz, A. ; Lagowski, J. ; Hoff, A. ; Dyukov, V. ; Pravdivtsev, A. ; Kornienko, I.
Pub. info.: ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands.  pp.73-82,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-30
2.

Conference Proceedings

Conference Proceedings
Lagowski, J. ; Hoff, A. ; Jastrzebski, L. ; Edelman, P. ; Esry, T.
Pub. info.: Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.437-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 428
3.

Conference Proceedings

Conference Proceedings
Edelman, P. ; Lagowski, J. ; Savchouk, A. ; Hoff, A. ; Jastrzebski, L. ; Persson, E.
Pub. info.: Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.443-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 428