1.

Conference Proceedings

Conference Proceedings
Tachibana,R. ; Shimizu,S. ; Nakamura,T. ; Kobayashi,S.
Pub. info.: Security and Watermarking of Multimedia Contents III.  4314  pp.104-115,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4314
2.

Conference Proceedings

Conference Proceedings
He,L.F. ; Kobayashi,S.
Pub. info.: Third International Conference on Experimental Mechanics : 15-17 October, 2001, Beijing China.  4537  pp.119-122,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4537
3.

Conference Proceedings

Conference Proceedings
Kobayashi,S. ; Horigome,T. ; Yamatsu,H. ; Masuhara,S. ; Saito,K.
Pub. info.: Optical data storage 2000 : 14-17 May, 2000, Whistler, Canada.  pp.12-15,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4090
4.

Conference Proceedings

Conference Proceedings
Kobayashi,S. ; Kimura,H.
Pub. info.: Mechanical alloying : proceedings of the International Symposium on Mechanical Alloying held in Kyoto, Japan, May 7-10, 1991.  pp.97-104,  1992.  Zurich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 88-90
5.

Conference Proceedings

Conference Proceedings
Hollenbach,U. ; Eckstein,H. ; Fabricius,N. ; Krause,M. ; Kobayashi,S.
Pub. info.: Functional Photonic and Fiber Devices.  pp.123-130,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2695
6.

Conference Proceedings

Conference Proceedings
Kobayashi,S. ; Nishitani,E. ; Shimamura,H. ; Yajima,A. ; Kishimoto,S. ; Yoneoka,Y. ; Uchida,H. ; Morioka,N.
Pub. info.: Process, Equipment, and Materials Control in Integrated Circuit Manufacturing.  pp.80-90,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2637
7.

Conference Proceedings

Conference Proceedings
Narahara,T. ; Kobayashi,S. ; Hattori,M. ; Shimpuku,Y. ; Enden,G.van den ; Kahlman,J.A. ; Dijk,M.van ; Woudenberg,R.van
Pub. info.: ISOM/ODS '99 : joint international symposium on Optical Memory and Optical Data Strage 1999, 11-15 July 1999 Sheraton Kauai Resort, Koloa, Howaii.  pp.50-52,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3864
8.

Conference Proceedings

Conference Proceedings
Kobayashi,S. ; Oka,N. ; Watanabe,K. ; Ohmori,K. ; Inoue,M. ; Iguchi,K.
Pub. info.: 19th Annual Symposium on Photomask Technology : 15-17 September 1999, Monterey, California.  Part1  pp.288-296,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3873
9.

Conference Proceedings

Conference Proceedings
Iimura,Y. ; Akiyama,H. ; Li,X.T. ; Kobayashi,S.
Pub. info.: Liquid Crystal Materials, Devices, and Applications VI.  pp.8-18,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3297
10.

Conference Proceedings

Conference Proceedings
Sueoka,K. ; Ikeda,N. ; Yamamoto,T. ; Kobayashi,S.
Pub. info.: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.523-524,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 117-118
11.

Conference Proceedings

Conference Proceedings
Kobayashi,S.
Pub. info.: Integrated Optics Devices: Potential for Commercialization.  pp.264-270,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2997
12.

Conference Proceedings

Conference Proceedings
Kobayashi,S. ; Terai,K. ; Tamangawa,T.
Pub. info.: XI International Symposium on Gas Flow and Chemical Lasers and High-Power Laser Conference : 25-30 August 1996, Heriot-Watt University, Edinburgh, UK.  pp.92-95,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3092
13.

Conference Proceedings

Conference Proceedings
Saito,Y. ; Takahashi,K. ; Nomura,E. ; Mineuchi,K. ; Kawahara,T.D. ; Nomura,A. ; Kobayashi,S. ; Ishii,H.
Pub. info.: Advances in laser remote sensing for terrestrial and oceanographic applications : 21-22 April 1997, Orlando, Florida.  pp.190-198,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3059
14.

Conference Proceedings

Conference Proceedings
Kobayashi,S. ; Furue,H.
Pub. info.: Display technologies II : 9-11 July 1998, Taipei, Taiwan.  pp.2-7,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3421
15.

Conference Proceedings

Conference Proceedings
Kobayashi,S. ; Iimura,Y.
Pub. info.: Liquid Crystal Materials, Devices, and Applications V.  pp.40-51,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3015
16.

Conference Proceedings

Conference Proceedings
Hashimoto,K. ; Usui,S. ; Hasebe,S. ; Murota,M. ; Nakayama,T. ; Matsuoka,F. ; Inoue,S. ; Kobayashi,S. ; Yamamoto,K.
Pub. info.: Optical microlithography XI : 25-27 February 1998, Santa Clara, California.  pp.224-233,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3334
17.

Conference Proceedings

Conference Proceedings
Kobayashi,S. ; Uno,T. ; Yamamoto,K. ; Tanaka,S. ; Kotani,T. ; Inoue,S. ; Higurashi,H. ; Watanabe,S. ; Yano,M. ; Ohki,S. ; Tsunakawa,K.
Pub. info.: Optical microlithography XII : 17-19 March 1999, Santa Clara, California.  Part2  pp.614-621,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3679
18.

Conference Proceedings

Conference Proceedings
Kobayashi,S. ; Sasaki,F. ; Murata,K. ; Noguchi,T. ; Ohonishi,T.
Pub. info.: Organic Photonic Materials and Devices III.  4279  pp.153-160,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4279
19.

Conference Proceedings

Conference Proceedings
Kikuchi,M. ; Tamura,H. ; Ono,M. ; Miyauchi,H. ; Kobayashi,S.
Pub. info.: Automatic target recognition X : 26-28 April 2000, Orlando, USA.  pp.465-475,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4050
20.

Conference Proceedings

Conference Proceedings
Kobayashi,S. ; Watanabe,K. ; Ohmori,K.
Pub. info.: 20th Annual BACUS Symposium on Photomask Technology.  4186  pp.801-809,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4186
21.

Conference Proceedings

Conference Proceedings
Sueoka,K. ; Akatsuka,M. ; Nishihara,K. ; Yamamoto,T. ; Kobayashi,S.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1737-1742,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201