1.

Conference Proceedings

Conference Proceedings
Wimbauer,T. ; Brandt,M.S. ; Bayerl,M.W. ; Stutzma,M. ; Hofmann,D.M. ; Mochizuki,Y. ; Mizuta,M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1309-1314,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Hofmann,D.M. ; Meyer,B.K. ; Christmann,P. ; Wimbauer,T. ; Stadler,W. ; Nikolov,A. ; Scharmann,A. ; Hofstatter,A.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1673-1678,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201