1.

Conference Proceedings
Conference Proceedings
1. Gas detection with work function sensors
Doll,T. ; Eisele,I.
Pub. info.: Chemical microsensors and applications : 4-5 November 1998, Boston, Massachusetts.  pp.96-105,  1998.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3539
2.

Conference Proceedings
Conference Proceedings
2. Plasma Processing for the Fabrication of a Nanotransistor
Tandon,U.S. ; Eisele,I.
Pub. info.: Semiconductor Devices.  pp.641-643,  1996.  Bellingham, WA, New Delhi.  SPIE-The International Society for Optical Engineering — Narosa
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2733
3.

Conference Proceedings
Conference Proceedings
3. Positrou Lifetime Measurements of Delta Doped MBE Grown Silicon Structures
Stormer,J. ; Willutzki,P. ; Britton,D.T. ; Trifishauser,W. ; Kiunke,W. ; Hansch,W. ; Eisele,I.
Pub. info.: Positron annihilation : ICPA-10 : Proceedings of the 10th International Conference on Positron Annihilation, May 23-29, 1994, Beijing, China.  Part1  pp.213-216,  1995.  Aederlmannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 175-178
4.

Conference Proceedings
Conference Proceedings
4. Alternative Gate Insulators for Deep Sub-Micron Channel Length MOSFETs
Rao,V.Ramgopal ; Eisele,I. ; Grabolla,T.
Pub. info.: Semiconductor Devices.  pp.54-56,  1996.  Bellingham, WA, New Delhi.  SPIE-The International Society for Optical Engineering — Narosa
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2733