Bitou, Y. ; Inaba, H. ; Hong, F. -L. ; Takatsuji, T. ; Onae, A.
Pub. info.:
Recent Developments in Traceable Dimensional Measurements III. pp.58790Y-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering