Charged particle detection, diagnostics, and imaging : 30 July - 2 August 2001 San Diego, USA. pp.148-155, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China. pp.60-63, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Multilayer and grazing incidence X-ray/EUV optics III : 5-6 August, 1996, Denver, Colorado. pp.156-157, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Laser interferometry IX : techniques and analysis : 20-21 July 1998, San Diego, California. pp.454-456, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
International Conference on Sensors and Control Techniques (ICSC 2000). pp.175-178, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
International Conference on Holography and Optical Information Processing (ICHOIP '96). pp.474-477, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering