Object detection, classification, and tracking technologies : 22-24 October 2001, Wuhan, China. pp.118-123, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Medical imaging 1998, Image processing : 23-26 February 1998, San Diego, California. Part 2 pp.1547-1555, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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International Workshop on New Approaches to High-Tech Materials, Nondestructive Testing and Computer Simulations in Materials Science and Engineering : 9-13 June 1997, St. Petersburg, Russia. pp.98-105, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 7-11 June 1999, St. Petersburg, Russia. pp.88-96, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Laser interferometry X : techniques and analysis : 31 July-1 August 2000, Sandiego, USA. Part A pp.241-248, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.585-590, 1995. Zurich, Switzerland. Trans Tech Publications
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Fiber optic sensors V : 6-7 November 1996, Beijing, China. pp.421-425, 1996. Bellingham, Wash. USA. SPIE-The International Society for Optical Engineering
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Detectors, focal plane arrays, and applications : 4-5 November 1996, Beijing, China. pp.211-215, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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