1.

Conference Proceedings

Conference Proceedings
Song,D. ; Qian,W. ; Sun,X. ; Li,J. ; Zheng,B. ; Clark,R.A.
Pub. info.: Object detection, classification, and tracking technologies : 22-24 October 2001, Wuhan, China.  pp.118-123,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4554
2.

Conference Proceedings

Conference Proceedings
Zheng,B. ; Chang,Y.-H. ; Good,W.F. ; Gur,D.
Pub. info.: Medical imaging 1998, Image processing : 23-26 February 1998, San Diego, California.  Part 2  pp.1547-1555,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3338
3.

Conference Proceedings

Conference Proceedings
Schulke,L. ; Zheng,B.
Pub. info.: International Workshop on New Approaches to High-Tech Materials, Nondestructive Testing and Computer Simulations in Materials Science and Engineering : 9-13 June 1997, St. Petersburg, Russia.  pp.98-105,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3345
4.

Conference Proceedings

Conference Proceedings
Luo,H. ; Schulke,L. ; Zheng,B.
Pub. info.: Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 7-11 June 1999, St. Petersburg, Russia.  pp.88-96,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4064
5.

Conference Proceedings

Conference Proceedings
Zheng,B. ; Lee,P.C.K.
Pub. info.: Laser interferometry X : techniques and analysis : 31 July-1 August 2000, Sandiego, USA.  Part A  pp.241-248,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4101
6.

Conference Proceedings

Conference Proceedings
Michel,J. ; Palm,J. ; Gan,F. ; Ren,F.Y.G. ; Zheng,B. ; Dunham,S.T. ; Kimerling,L.C.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.585-590,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
7.

Conference Proceedings

Conference Proceedings
Michel,J. ; Ren,F.Y.G. ; Zheng,B. ; Jacobson,D.C. ; Poate,J.M. ; Kimerling,L.C.(invited)
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.707-714,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
8.

Conference Proceedings

Conference Proceedings
Zheng,B. ; Chen,Z.
Pub. info.: Fiber optic sensors V : 6-7 November 1996, Beijing, China.  pp.421-425,  1996.  Bellingham, Wash. USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2895
9.

Conference Proceedings

Conference Proceedings
Zheng,B. ; Chen,Z.
Pub. info.: Detectors, focal plane arrays, and applications : 4-5 November 1996, Beijing, China.  pp.211-215,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2894
10.

Conference Proceedings

Conference Proceedings
Wang,X.-H. ; Zheng,B. ; Chang,Y.-H. ; Good,W.F.
Pub. info.: Medical Imaging 1999: Image Processing.  Part2  pp.1574-1580,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3661