X-ray optics, instruments, and missions IV : 30-31 July 2000, San Diego, USA. pp.16-24, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Machine vision applications in industrial inspection VI : 27 January 1998, San Jose, California. pp.149-155, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany. pp.712-719, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany. pp.370-378, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany. pp.379-385, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
X-ray optics, instruments, and missions II : 18-20 July 1999, Denver, Colorado. pp.11-21, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Zhang,W.W. ; Petre,R. ; Peele A. N. ; Jahoda,K. ; Marshall,F. E. ; Soong,Y. ; White,N. E.
Pub. info.:
EUV, X-ray, and gamma-ray instrumentation for astronomy VIII : 30 July - 1 August 1997, San Diego, California, Oswald H. W. Siegmund, Mark A. Gummin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering. pp.466-480, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Three-Dimensional Imaging, Optical Metrology, and Inspection IV. pp.76-79, 1998. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering