1.

Conference Proceedings
Conference Proceedings
1. Photovia Technology:Some Important Aspects for Reliability
Zhang,Suixin ; Baets,J.De ; Calster,A.Van ; Corlatan,D. ; Langhe,P.De ; Allaert,K.
Pub. info.: Proceedings : 1999 International Symposium on Microelectronics : 26-28 October 1999, Chicago, Illinois.  pp.240-245,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3906
2.

Conference Proceedings
Conference Proceedings
2. The Fabrication and Reliability of a Photovia Test Vehicle for MCM-L Applications
Zhang,Suixin ; Vereeken,M. ; Baets,J.De ; Peeters,J. ; Allaert,K. ; Calster,A.Van
Pub. info.: Microelectronics : 1-4 November 1998, San Diego Convention Center, San Diego, California.  pp.53-58,  1998.  Bellingham, Wash., Reston, VA.  SPIE - The International Society for Optical Engineering — IMAPS
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3582