1.

Conference Proceedings
Conference Proceedings
1. Characterization of Defects Generated During Boron Diffusion in SiC
Lin, Xue-feng ; Smith, Stephen P. ; Ma, Xianyun ; Wang, Liang ; Sudarshan, Tangali S. ; Zhang, Qingchun ; Chang, Hsueh-Rong
Pub. info.: Silicon carbide 2004--materials, processing and devices : symposium held April 14-15, 2004, San Francisco, California, U.S.A..  pp.169-174,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 815
2.

Conference Proceedings
Conference Proceedings
2. Study of Germanium Out-Diffusion in HfO2 Gate Dielectric of MOS Device on Germanium Substrate
Zhang, Qingchun ; Wu, Nan ; Bera, L. K. ; Zhu, Chunxiang
Pub. info.: Progress in compound semiconductor materials -- electronic and optoelectronic applications.  pp.449-454,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 829