Zhang, D.H. ; Sun, L. ; Yoon, S.F. ; Kam, C.H. ; Fan, W.J. ; Mei, T.
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Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China. pp.75-82, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Zhang, D.H. ; Sun, L. ; Shi, W. ; Yoon, S.F. ; Li, N. ; Yuan, Z. ; Chu, J.H.
Pub. info.:
Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China. pp.321-327, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Prasad, K. ; Yuan, X.L. ; Tan, C.M. ; Zhang, D.H. ; Li, C. Y. ; Wang, S.R. ; Yuan, S.Y.J. ; Xie, J.L. ; Gui, D. ; Foo, P.D.
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Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A.. pp.395-400, 2002. Warrendale. Materials Research Society
Loh, S.W. ; Zhang, D.H. ; Li, C.Y. ; Liu, R. ; Wee, A.T.S. ; Foo, P.D. ; Xie, Joseph ; Prasad, K. ; Tan, C.M. ; Lee, Y.K.
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Semiconductor technology (ISTC 2001) : proceedings of the 1st International Conference on Semiconductor Technology. pp.116-122, 2001. Pennington, N.J.. Electrochemical Society
Semiconductor technology (ISTC 2001) : proceedings of the 1st International Conference on Semiconductor Technology. pp.123-130, 2001. Pennington, N.J.. Electrochemical Society