Development and testing of the EVS 2000 enhanced vision system

Development and testing of the EVS 2000 enhanced vision system

Author(s):

Way, S.P. ( Max-Viz, Inc. (USA) )

Publication title:

Enhanced and synthetic vision 2003 : 21 April, 2003, Orlando, Florida, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5081

Pub. Year:

2003

Page(from):

51

Page(to):

57

Pages:

7

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819449405 [0819449407]

Language:

English

Call no.:

P63600/5081

Type:

Conference Proceedings

Details

TDL ID:	ZA00013069
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Enhanced and synthetic vision
Conf. info. (Number):	2003
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	2003.04.21

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