1.

Conference Proceedings
Conference Proceedings
1. THE INITIAL STAGES OF DIAMOND GROWTh ON SI(100) STUDIED BY CONVENTIONAL AND CROSS-SECTIONAL MICRO-RAMAN SPECTROSCOPY
Werninghaus, T. ; Laufer, S. ; Hinneberg, H.-J. ; Zahn, D.R.T.
Pub. info.: Proceedings of the Fourth International Symposium on Diamond Materials.  pp.151-158,  1995.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-4
2.

Conference Proceedings
Conference Proceedings
2. MBE GROWN GaAs ON Si (100) STUDIED BY INFRARED SPECTROSCOPY
Eickhoff, T. ; Morley, S. ; Zahn, D.R.T. ; Richter, W. ; Woolf, D.A. ; Westwood, D.I. ; Wiliams, R.H.
Pub. info.: Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.493-498,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 160
3.

Conference Proceedings
Conference Proceedings
3. Raman Spectroscopy of Self-Assembled InAs Quantum Dots in Wide-Bandgap Matrices of AlAs and Aluminium Oxide
Tenne, D.A. ; Milekhin, A.G. ; Bakarov, A.K. ; Bajutova, O.R. ; Haisler, V.A. ; Toropov, A.I. ; Schulze, S. ; Zahn, D.R.T.
Pub. info.: Quantum confined semiconductor nanostructures : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.141-292,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 737
4.

Conference Proceedings
Conference Proceedings
4. Formation of InAs quantum dots in an aluminium oxide matrix by lateral selective wet oxidation
Tenne, D.A. ; Bajutova, O.R. ; Bakarov, A.K. ; Toropov, A.I. ; Milekhin, A.G. ; Haisler, V.A. ; Zahn, D.R.T. ; Gutakovsky, A.K.
Pub. info.: Sixth International Conference on Material Science and Material Properties for Infrared Optoelectronics.  pp.235-240,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5065