Surface scattering and diffraction for advanced metrology II : 9 July 2002 Seattle, Washington, USA. pp.126-137, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Huang, W. ; Lin, Y. ; Fu, K. ; Kitaygorodskiy, A. ; Riddle, L.A. ; Yu, Y.J. ; Carroll, D.L. ; Sun, Y.-P.
Pub. info.:
Fullerenes : fullerenes for the new millennium : proceedings of the International Symposium on Fullerenes, Nanotubes, and Carbon Nanoclusters. pp.223-243, 2001. Pennington, N.J.. Electrochemical Society