1.

Conference Proceedings

Conference Proceedings
Wan, Y. ; Zeng, Q. ; Han, K. ; Zhu, D. ; Li, T. ; Han, H. ; Yu, S.
Pub. info.: ICO20 : lasers and laser technologies : 21-26 August, 2005, Changchun, China.  pp.60280A-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6028
2.

Conference Proceedings

Conference Proceedings
Yu, S. ; Tan, T. Y. ; Gosele, U.
Pub. info.: Advanced III-V compound semiconductor growth, processing and devices : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.747-758,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 240
3.

Conference Proceedings

Conference Proceedings
Tan, T. Y. ; Yu, S. ; Gosele, U.
Pub. info.: Advanced III-V compound semiconductor growth, processing and devices : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.739-746,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 240
4.

Conference Proceedings

Conference Proceedings
Lv, Y. ; Yu, S. ; Mao, Y.
Pub. info.: Applications of photonic technology [7C] : closing the gap between theory, development, and application, 7C--Photonics North 2004: Photonic applications in telecommunications, sensors, software, and lasers.  pp.628-635,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5579
5.

Conference Proceedings

Conference Proceedings
Gu, J. ; Tong, X. ; Zou, Y. ; He, S. ; Yu, S.
Pub. info.: Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California.  pp.440-447,  1999.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3678
6.

Conference Proceedings

Conference Proceedings
Ritenour, A. ; Lee, M. ; Lu, N. ; Bai, W. ; Yu, S. ; Fitzgerald, E. ; Kwong, D.L. ; Antoniadis, D.
Pub. info.: Advanced short-time thermal processing for Si-based CMOS devices : proceedings of the international symposium.  pp.406-411,  2004.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-01
7.

Conference Proceedings

Conference Proceedings
Yu, S. ; Natishan, P.
Pub. info.: Proceedings of the Symposium on Critical Factors in Localized Corrosion III : a symposium in honor of the 70th birthday of Jerome Kruger.  pp.256-264,  1998.  Pennington, New Jersey.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-17
8.

Conference Proceedings

Conference Proceedings
Yi, Q. ; Wang, X. ; Huang, J. ; Qian, Y. ; Yu, S.
Pub. info.: Remote sensing and modeling of ecosystems for sustainability : 2-4 August 2004, Denver, Colorado, USA.  pp.390-399,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5544
9.

Conference Proceedings

Conference Proceedings
Kim, D. M. ; Qian, F. ; Bickford, C. U ; Yu, S.
Pub. info.: Polysilicon films and interfaces : symposium held December 1-3, 1987, Boston, Massachusetts, U.S.A..  pp.261-266,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 106
10.

Conference Proceedings

Conference Proceedings
Tan, T. Y. ; You, H. M. ; Yu, S. ; Goesele, U. M. ; Jager, W. ; Zypman, F. ; Tsu, R. ; Lee, S.-T
Pub. info.: Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A..  pp.873-880,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 262