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10 results

Conference Proceedings

1. Comparative analysis of photoluminescence in nano-sized amorphous and crystalline silicon embedded in silicon nitride thin film [6029-18]

Ding W. ; Yu W. ; Zhang J. ; Yang Y. ; Fu G.

Pub. info.:	ICO20 : materials and nanostructures : 21-26 August, 2005, Changchun, China. pp.60290I-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6029

Conference Proceedings

2. Structure change detection of images based on biological vision principle [6044-05]

Chen T. ; Yu W. ; Jiang Y. ; Su Y.

Pub. info.:	MIPPR 2005 : Image analysis techniques : 31 October-2 November 2005, Wuhan, China. pp.604405-604405, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6044

Conference Proceedings

3. Substrate bias effect on preparation of nanocrystalline silicon carbide thin films in helicon wave plasma chemical vapor depostion [6029-34]

Yu W. ; Lu W. ; Wang C. ; Ding W. ; Fu G.

Pub. info.:	ICO20 : materials and nanostructures : 21-26 August, 2005, Changchun, China. pp.60290Y-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6029

Conference Proceedings

4. Thermal annealing effects on the optical properties of amorphous silicon carbide films deposited by pulsed laser ablation [6029-39]

Yu W. ; Lu W. ; Zhang L. ; Sun Y. ; Fu G.

Pub. info.:	ICO20 : materials and nanostructures : 21-26 August, 2005, Changchun, China. pp.602913-602913, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6029

Conference Proceedings

5. Regions of interest detection in large remote sensing images [6044-80]

Geng Z. ; Yu W. ; Jiang Y. ; Su Y.

Pub. info.:	MIPPR 2005 : Image analysis techniques : 31 October-2 November 2005, Wuhan, China. pp.604428-604428, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6044

Conference Proceedings

6. Cloud vertical overlapping and cloud inhomogeneities: Their impact on model validation

Le Treut H. ; Seze G. ; Yu W. ; Doutriaux M.

Pub. info.:	Clouds, chemistry and climate. pp.118-121, 1996. Berlin. Springer
Title of ser.:	NATO ASI series. Series I, Global environmental change
Ser. no.:	35

Conference Proceedings

7. Effect of radio frequency bias on the optical and structural properties of nanocrystalline SiC films deposited by helicon wave plasma enhanced chemical vapor deposition [6020-122]

Yu W. ; Wang C. ; Lu W. ; Cui S. ; Fu G.

Pub. info.:	Optoelectronic Materials and Devices for Optical Communications. pp.60203D-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6020

Conference Proceedings

8. Effects of magnetic field on the structural and optical properties of nanocrystalline silicon thin films deposited by helicon wave plasma chemical vapor deposittion [6020-121]

Yu W. ; Zhang L. ; Wang B. ; Han X. ; Sun W. ; Fu G.

Pub. info.:	Optoelectronic Materials and Devices for Optical Communications. pp.60203C-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6020

Conference Proceedings

9. Photoluminescene properties of hydrogenated amorphous silicon nitride thin films deposited by helicon wave plasma chemical vapor deposition [6020-123]

Fu G. ; Yu W. ; Lu W. ; Zhu H. ; Zhang L. ; Ding W.

Pub. info.:	Optoelectronic Materials and Devices for Optical Communications. pp.60203E-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6020

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Conference Proceedings

10. Extracting sematic object based on color feature using ISODAT algorithm [6043-87]

Yu W. ; Yu Y. ; China Univ. of Technology (China)

Pub. info.:	MIPPR 2005: SAR and Multispectral Image Processing. pp.60432F-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6043

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Author: Yu W.