1.

Conference Proceedings

Conference Proceedings
Shimizu,N. ; Yoshida,A. ; Ikeda,M. ; Aoki,S.
Pub. info.: Micromachining and microfabrication process technology VI : 18-20 September 2000, Santa Clara, USA.  pp.314-321,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4174
2.

Conference Proceedings

Conference Proceedings
Mihara,T. ; Kawai,N. ; Yoshida,A. ; Sakurai,I. ; Kamae,T. ; Matsuoka,M. ; Shirasaki,Y. ; Sugizaki,M. ; Yuan,W.M. ; Tanaka,I.
Pub. info.: X-ray, and gamma-ray instrumentation for astronomy XII : 31 July and 2 August 2001 San Diego, USA.  pp.173-186,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4497
3.

Conference Proceedings

Conference Proceedings
Kawai,H. ; Suzuki,M. ; Yoshida,A.
Pub. info.: Precision plastic optics for optical storage, displays, imaging, and communications : 30-31 July 1997, San Diego, California.  pp.42-52,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3135
4.

Conference Proceedings

Conference Proceedings
Yoshida,A. ; Tsuchiya,K. ; Wakahara,A.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.164-167,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
5.

Conference Proceedings

Conference Proceedings
Sakurai,I. ; Mihara,T. ; Kawai,N. ; Yoshida,A. ; Shirasaki,Y. ; Matsuoka,M. ; Sugizaki,M. ; Kamae,T.
Pub. info.: X-ray, and gamma-ray instrumentation for astronomy XI : 2-4 August 2000 San Diego, USA.  pp.511-519,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4140
6.

Conference Proceedings

Conference Proceedings
Tomo,Y. ; Matsuoka,K. ; Kojima,Y. ; Yoshida,A. ; Shimizu,I. ; Yamabe,M.
Pub. info.: Emerging lithographic technologies IV : 28 February-1 March 2000, Santa Clara, USA.  pp.225-234,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3997
7.

Conference Proceedings

Conference Proceedings
Tomida,H. ; Matsuoka,M. ; Ueno,S. ; Torii,K. ; Sugizaki,M. ; Yuan,W.M. ; Komatsu,S. ; Shirasaki,Y. ; Kawai,N. ; Yoshida,A. ; Mihara,T. ; Sakurai,I. ; Negoro,H. ; Tsunemi,H. ; Yamauchi,M. ; Tanaka,I.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.178-185,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
8.

Conference Proceedings

Conference Proceedings
Shirasaki,Y. ; Kawai,N. ; Yoshida,A. ; Matsuoka,M. ; Namiki,M. ; Sakurai,I. ; Yamauchi,M. ; Takagishi,K. ; Hatsukade,I. ; Fenimore,E.E. ; Galassi,M.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.166-177,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
9.

Conference Proceedings

Conference Proceedings
Sebag,J. ; Kitaya,N. ; Ansari,R.R. ; Karagoezian,H.L. ; Yoshida,A.
Pub. info.: Ophthalmic technologies X : 22-23 January 2000, San Jose, USA.  pp.69-77,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3908
10.

Conference Proceedings

Conference Proceedings
Tomida,H. ; Matsuoka,M. ; Torii,K. ; Ueno,S. ; Sugizaki,M. ; Yuan,W.M. ; Shirasaki,Y. ; Sakano,M. ; Komatsu,S. ; Tsunemi,H. ; Miyata,E. ; Kawai,N. ; Yoshida,A. ; Mihara,T.
Pub. info.: X-ray, and gamma-ray instrumentation for astronomy XI : 2-4 August 2000 San Diego, USA.  pp.304-312,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4140