1.

Conference Proceedings
Conference Proceedings
1. Deposition of potassium lithium niobate films by sol-gel method
Zhang,H.X. ; Zhou,Y. ; Kam,C.H. ; Han,X.Q. ; Cheng,S.D. ; Ooi,B.S. ; Lam,Y.L. ; Chan,Y.C. ; Sun,Z. ; Yu,M.B. ; Shi,X. ; Yoon,S.F.
Pub. info.: Design, fabrication, and characterization of photonic devices : 30 November-3 December 1999, Singapore.  pp.425-432,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3896
2.

Conference Proceedings
Conference Proceedings
2. New process for nanometer-scale devices
Chen,Y. ; Hadley,P. ; Harmans,C.J.P.M. ; Mooij,J.E. ; Ng,G.I. ; Yoon,S.F.
Pub. info.: Microlithographic Techniques in IC Fabrication.  pp.138-145,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3183
3.

Conference Proceedings
Conference Proceedings
3. Influence of IMP copper flash layer on the properties of copper films deposited by metal organic chemical vapor deposition
Li,C.Y. ; Zhang,D.H. ; Qian,Y. ; Narayanan,B. ; Wu,J.J. ; Yu,B. ; Jiang,Z.X. ; Foo,P.D. ; Xie,J. ; Zhang,Q. ; Yoon,S.F.
Pub. info.: Multilevel Interconnect Technology III.  pp.46-49,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3883
4.

Conference Proceedings
Conference Proceedings
4. InGaAlAs/InAlAs multiple quantum well structures grown by molecular beam epitaxy for tong-wavelength infrared detection
Zhang,D.H. ; Zhang,W.M. ; Zhang,P.H. ; Osotchan,T. ; Yoon,S.F. ; Shi,X. ; Liu,R. ; Wee,T.S.
Pub. info.: Photonics Technology into the 21st Century: Semiconductors, Microstructures, and Nanostructures.  pp.183-190,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3899