1.

Conference Proceedings

Conference Proceedings
Tamura, N. ; Chung, J-S. ; Ice, G. E. ; Larson, B. C. ; Budai, J. D. ; Tischler, J. Z. ; Yoon, M. ; Williams, E. L. ; Lowe, W. P.
Pub. info.: Materials reliability in microelectronics IX : symposium held April 6-8, 1999, San Francisco, California, U.S.A..  pp.175-,  1999.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 563
2.

Technical Paper

Technical Paper
Yoon, M. ; Lee, M. ; Sunwoo, M.
Pub. info.: 2006 SAE world congress : technical paper.  2006.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2006
3.

Technical Paper

Technical Paper
Park, S. ; Yoon, M. ; Sunwoo, M.
Pub. info.: 2003 SAE world congress : technical paper.  2003.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2003
4.

Technical Paper

Technical Paper
Lee, K. ; Kwon, M. ; Sunwoo, M. ; Yoon, M.
Pub. info.: 14th Asia Pacific Automotive Engineering Conference : SAE technical paper.  2007.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2007
5.

Technical Paper

Technical Paper
Yoon, M. ; Lee, K. ; Sunwoo, M. ; Oh, B.
Pub. info.: 2007 SAE world congress : technical paper.  2007.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2007