1.
Conference Proceedings |
Choi, S.-H. ; Park, T.-H. ; Kim, E. ; Youn, H.-J. ; Lee, D.-Y. ; Ban, Y.-C. ; Je, A.-Y. ; Kim, D.-H. ; Hong, J.-S. ; Kim, Y.-H. ; Yoo, M.-H. ; Kong, J.-T.
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2.
Conference Proceedings |
Choi, S.-H. ; Park, J.-S. ; Park, C.-H. ; Chung, W.-Y. ; Kim, I.-S. ; Kim, D.-H. ; Kim, Y.-H. ; Yoo, M.-H. ; Kong, J.-T.
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3.
Conference Proceedings |
Choi, J.-S. ; Shin, J.-P. ; Lee, J.-B. ; Yoo, M.-H. ; Kong, J.-T.
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4.
Conference Proceedings |
Park, C.-H. ; Rhie, S.-U. ; Chio, S.-H. ; Kim, D.-H. ; Park, J.-S. ; Kim, Y.-H. ; Yoo, M.-H. ; Kong, J.-T.
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5.
Conference Proceedings |
Jang, T.H. ; Lee, J.-B. ; Shin, J.-P. ; Yoo, K.-J. ; Jung, D.-H. ; Park, Y.-H. ; Yoo, M.-H. ; Kong, J.-T.
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6.
Conference Proceedings |
Hong, J.-S. ; Park, C.-H. ; Kim, D.-H. ; Choi, S.-H. ; Ban, Y.-C. ; Kim, Y.-H. ; Yoo, M.-H. ; Kong, J.-T.
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7.
Conference Proceedings |
7. Simulation-based critical-area extraction and litho-friendly layout design for low-k1 lithography
Choi, S.-H. ; Ban, Y.-C. ; Lee, K.-H. ; Kim, D.-H. ; Hong, J.-S. ; Kim, Y.-H. ; Yoo, M.-H. ; Kong, J.-T.
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