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You can search for articles included in proceedings of international conferences and technical papers which Tokyo Tech Library holds.
Tokyo Tech members can obtain tables of contents of 17,000 foreign journals by SwetScan. Tokyo Tech Library does not cover all of them.
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1.
Conference Proceedings
Conference Proceedings
1.
CHARACTERISTICS AND RECOVERY OF Si SURFACES PLASMA ETCHING IN CHF3/C2F6
Park, H.-H. ; Kwon, K.H. ; Koak, B.-H. ; Lee, S.-M. ; Kwon, O-J. ; Kim, B.-W. ; Lee, J.-W. ; Yoo, J.-B. ; Sung, Y.-K.
Pub. info.:
Chemical surface preparation, passivation, and cleaning for semiconductor growth and processing : symposium held April 27-29, 1992, San Francisco, California, U.S.A.
. pp.219-224, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
259
2.
Conference Proceedings
Conference Proceedings
2.
Eye-type scanning mirror with dual vertical combs for laser display
Ko, Y.-C. ; Cho, J.-W. ; Mun, Y.-K. ; Jeong, H.-G. ; Choi, W.-K. ; Lee, J.-H. ; Kim, J.-W. ; Yoo, J.-B.
Pub. info.:
MOEMS Display and Imaging Systems III
. pp.14-22, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5721
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Author: Yoo, J.-B.
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English
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2000-2009
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1990-1999
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Conference Proceedings
(2)
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Cho, J.-W.
(1)
Choi, W.-K.
(1)
Jeong, H.-G.
(1)
Kim, B.-W.
(1)
Kim, J.-W.
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