Data mining and applications : 23-24 October 2001, Wuhan, China. pp.20-24, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Electro-optic and second harmonic generation materials, devices, and applications II : 18-19 September, 1998, Beijing, China. pp.73-83, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Organic photonic materials and devices II : 24-26 January 2000, San Jose, USA. pp.112-116, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Electro-Optic and second harmonic generation materials, devices, and applications. pp.183-190, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Electro-Optic and second harmonic generation materials, devices, and applications. pp.216-220, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China. pp.254-257, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Polarimetry and ellipsometry : 20-23 May, 1996, Kazimierz Dolny, Poland. pp.112-117, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Electro-optic and second harmonic generation materials, devices, and applications II : 18-19 September, 1998, Beijing, China. pp.117-121, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering