1.

Conference Proceedings

Conference Proceedings
Junjiroh Kikawa ; Yuki Horiuchi ; Eiji Shibata ; Masamitsu Kaneko ; Hirotaka Otake ; Tatsuya Fujishima ; Kentaro Chikamatsu ; Atsushi Yamaguchi ; Yasushi Nanishi
Pub. info.: Performance and reliability of semiconductor devices : symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A..  pp.157-162,  2009.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 1108
2.

Conference Proceedings

Conference Proceedings
Yasushi Nanishi
Pub. info.: Performance and reliability of semiconductor devices : symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A..  pp.19-28,  2009.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 1108