1.

Conference Proceedings
Conference Proceedings
1. WA4:16.8-GB double-decker phase-change disk
Kurokawa,K. ; Naito,M. ; Yasuda,K. ; Kashiwagi,T. ; Kawakubo,O.
Pub. info.: ISOM/ODS '99 : joint international symposium on Optical Memory and Optical Data Strage 1999, 11-15 July 1999 Sheraton Kauai Resort, Koloa, Howaii.  pp.197-199,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3864
2.

Conference Proceedings
Conference Proceedings
2. Exact Steady-state Probabilistic Density of Nonlinear Stochastic Systems,#259
Wang,R. ; Yasuda,K.
Pub. info.: Proceedings of the 17th International Modal Analysis Conference February 8-11, 1999 Hyatt Orlando Hotel Kissimmee, Florida.  Part2  pp.1603-1609,  1999.  Bethel, CT.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3727
3.

Conference Proceedings
Conference Proceedings
3. On-groove phase-change optical recording for a capacity of 25 GB
Ichimura,I. ; Masuhara,S. ; Nakano,J. ; Kasami,Y. ; Yasuda,K. ; Kawakubo,O. ; Osato,K.
Pub. info.: Optical data storage 2001 : 22-25 April 2001 Santa Fe, USA.  pp.168-177,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4342
4.

Conference Proceedings
Conference Proceedings
4. Multi-Component Laminate Moulding (MLM) (55)
Allan,P.S. ; Bevis,M.J. ; McCalla,A. ; Mubarak,Y. ; Yasuda,K.
Pub. info.: ANTEC 2002, annual technical conference, San Francisco, CA, May 5-9, 2002.  1  pp.670-674,  2002.  Brookfield, Conn..  Society of Plastic Engineers.
Title of ser.: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.: 60
5.

Conference Proceedings
Conference Proceedings
5. Electron Energy Dependence of Impurity Concentrations in Semiconductors by Electron Beam Doping(Superdiffusion)
Wada,T. ; Yasuda,K. ; Fujimoto,H. ; Masuda,H.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1619-1624,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201