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17 results

Conference Proceedings

1. Er-luminescence in MBE-grown AlGaAs

Gusev,O.B. ; Lindmark,E.K. ; Prineas,J.P. ; Bresler,M.S. ; Khitrova,G. ; Gibbs,H.M. ; Yassievich,I.N. ; Zakharchenya,B.P. ; Masterov,V.F.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part3 pp.1583-1588, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

Conference Proceedings

2. Recombination-induced defect heating and related phenomena

Yassievich,I.N. ; Abakumov,V.N. ; Pakhomov,A.A.

Pub. info.:	Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991. Pt.1 pp.511-516, 1992. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	83-87

Conference Proceedings

3. Shallow Acceptor States iu SiGe Quantum Wells

Kagan,M.S. ; Altukhov,I.V. ; Korolev,K.A. ; Orlov,D.V. ; Sinis,V.P. ; Thomas,S.G. ; Wang,K.L. ; Schmalz,K. ; Yassievich,I.N.

Pub. info.:	Ultrafast phenomena in semiconductors : proceedings of the 10th International Symposium on Ultrafast Phenomena in Semiconductors (10-UFPS), held in Vilnius, Lithuania, August/September, 1998. pp.233-236, 1999. Zurich-Uetikon, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	297-298

Conference Proceedings

4. Multiphonon Recombination in Semiconductors

Yassievich,I.N.

Pub. info.:	Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988. Part3 pp.1351-1360, 1989. Aederlmannsdorf, Switzwelns. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	38-41

Conference Proceedings

5. Resonance acceptor states and THz generation in uniaxially strained p-Ge

Altukhov,I.V. ; Chirkova,E.G. ; Kagan,M.S. ; Korolev,K.A. ; Sinis,V.P. ; Schmalz,K. ; Odnoblyudov,M.A. ; Yassievich,I.N.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part1 pp.71-76, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

Conference Proceedings

6. Acceptor states in boron doped SiGe quantum wells

Schmalz,K. ; Kagan,M.S. ; Altukhov,I.V. ; Korolev,K.A. ; Orlov,D.V. ; Sinis,V.P. ; Tomas,S.G. ; Wang,K.L. ; Yassievich,I.N.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part1 pp.91-96, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

Conference Proceedings

7. Poole-Frenkel Ionization of Ge:Hg in Terahertz Electromagnetic Fields

Ganichev,S.D. ; Mayerhofer,B. ; Yassievich,I.N. ; Diener,J. ; Prettl,W.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.1543-1546, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

Conference Proceedings

8. Excitation and de-excitation of erbium ions in semiconductor matrices

Yassievich,I.N. ; Bresler,M.S. ; Gusev,O.B. ; Khitrova,G.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part3 pp.1595-1600, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

Conference Proceedings

9. Effect of Interface on Capture and Emission Processes via Deep Centers

Yassievich,I.N. ; Pakhomov,A.A.

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.1 pp.579-582, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

10.

Conference Proceedings

10. Multiphonon Carrier Emission and Capture by Defects in Nanostructures

Yassievich,I.N. ; Pakhomov,A.A.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.491-495, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

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