Determining nanoscale physical properties of materials by microscopy and spectroscopy. pp.293-, 1994. Pittsburgh, Pa.. MRS - Materials Research Society
Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China. pp.29-33, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Makino, H. ; Kim, J. J. ; Chen, P. P. ; Cho, M. W. ; Yao, T.
Pub. info.:
Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China. pp.11-16, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Chen, P. P. ; Liu, G. J. ; Makino, H. ; Lu, W. ; Yao, T.
Pub. info.:
Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China. pp.103-106, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Yao, T. ; Okada, Y. ; Kawanami, H. ; Matsui, S. ; Imagawa, A. ; Ishida, K.
Pub. info.:
Heteroepitaxy on silicon II : symposium held April 21-23, 1987, Anaheim, California, U.S.A.. pp.63-68, 1987. Pittsburgh, Pa.. Materials Research Society