Multispectral and hyperspectral image acquisition and processing : 22-24 2001, Wuhan, China. pp.45-49, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Signal and data processing of small targets 2001 : 30 July-2 August 2001, San Diego, USA. pp.502-510, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California. pp.15-17, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California. pp.9-14, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Biomedical sensing, imaging, and tracking technologies I : 29-31 January 1996, San Jose, California. pp.290-296, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG. pp.158-165, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Emerging lithographic technologies III : 15-17 March 1999, Santa Clara, California. Part1 pp.56-62, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering