1.

Conference Proceedings

Conference Proceedings
Yang,L. ; Shen,M.
Pub. info.: Multispectral and hyperspectral image acquisition and processing : 22-24 2001, Wuhan, China.  pp.45-49,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4548
2.

Conference Proceedings

Conference Proceedings
Hsiao,B.S. ; Somani,R.H. ; Yang,L. ; Stein,R.S. ; Fruitwala,H. ; Agarwal,P. ; Tsou,A.H.
Pub. info.: ANTEC 2002, annual technical conference, San Francisco, CA, May 5-9, 2002.  2  pp.1926-1930,  2002.  Brookfield, Conn..  Society of Plastic Engineers.
Title of ser.: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.: 60
3.

Conference Proceedings

Conference Proceedings
Li,B. ; Yang,L. ; Mao,W. ; Tie,Q. ; Wang,X. ; Zhang,Z.
Pub. info.: Signal and data processing of small targets 2001 : 30 July-2 August 2001, San Diego, USA.  pp.502-510,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4473
4.

Conference Proceedings

Conference Proceedings
Liu,B. ; Yang,L. ; Fan,J. ; Zhang,J.
Pub. info.: Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California.  pp.15-17,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3275
5.

Conference Proceedings

Conference Proceedings
Liu,B. ; Fan,J. ; Yang,L. ; Wang,Q.
Pub. info.: Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California.  pp.9-14,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3275
6.

Conference Proceedings

Conference Proceedings
Yang,L. ; McStay,D. ; Quinn,P.J.
Pub. info.: Biomedical sensing, imaging, and tracking technologies I : 29-31 January 1996, San Jose, California.  pp.290-296,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2676
7.

Conference Proceedings

Conference Proceedings
Steinchen,W. ; Yang,L. ; Kupfer,G. ; Mackel,P. ; Thiemich,A.
Pub. info.: Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG.  pp.158-165,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3098
8.

Conference Proceedings

Conference Proceedings
Leonard,Q.J. ; Bansel,J. ; Yang,L. ; Vladimirsky,O. ; Bollepalli,B.S. ; Khan,M. ; Vladimirsky,Y. ; Cerrina,F. ; Taylor,J.W. ; Simon,K. ; Rathbun,L.C. ; Tiberio,R.C.
Pub. info.: Emerging lithographic technologies III : 15-17 March 1999, Santa Clara, California.  Part1  pp.56-62,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3676
9.

Conference Proceedings

Conference Proceedings
Schlick,T. ; Yang,L.
Pub. info.: Multiscale computational methods in chemistry and physics.  pp.293-305,  2001.  Amsterdam.  IOS Press
Title of ser.: NATO science series. Series 3, Computer and systems sciences
Ser. no.: 177
10.

Conference Proceedings

Conference Proceedings
Yang,L. ; Steinchen,W. ; Kupfer,G.
Pub. info.: Laser interferometry VIII--techniques and analysis : 6-7 August, 1996, Denver Colorado.  pp.175-183,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2860