Ko, Y. K. ; Lee, S. ; Yang, H. J. ; Shim, C. ; Jung, D. ; Lee, J. G.
Pub. info.:
Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics-2003 : symposium held April 21-25, 2003, San Francisco, California, U.S.A.. pp.497-502, 2003. Warrendale, Pa.. Materials Research Society