1.

Conference Proceedings

Conference Proceedings
Watanabe,W. ; Yamada,K. ; Kuroda,D. ; Shinagawa,T. ; Itoh,K. ; Nishii,J.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan.  pp.340-343,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4416
2.

Conference Proceedings

Conference Proceedings
Yamada,K. ; Watanabe,W. ; Itoh,K. ; Nishii,J.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan.  pp.344-347,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4416
3.

Conference Proceedings

Conference Proceedings
Yamamoto,K. ; Yamada,K.
Pub. info.: Enhanced and synthetic vision 2001 : 16-17 April, 2001, Orlando, USA.  pp.76-85,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4363
4.

Conference Proceedings

Conference Proceedings
Tanida,J. ; Kitamura,Y. ; Yamada,K. ; Miyatake,S. ; Miyamoto,M. ; Morimoto,T. ; Masaki,Y. ; Kondou,N. ; Miyazaki,D. ; Ichioka,Y.
Pub. info.: Micro- and nano-optics for optical interconnection and information processing : 29-31 July 2001, San Diego, USA.  pp.34-41,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4455
5.

Conference Proceedings

Conference Proceedings
Yamada,K. ; Tomari,K. ; Harada,T. ; Hamada,H.
Pub. info.: ANTEC 2002, annual technical conference, San Francisco, CA, May 5-9, 2002.  3  pp.3177-3181,  2002.  Brookfield, Conn..  Society of Plastic Engineers.
Title of ser.: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.: 60
6.

Conference Proceedings

Conference Proceedings
Kanamaru,T. ; Yamada,K. ; Ichikawa,T. ; Naemura,T. ; Aizawa,K. ; Saito,T.
Pub. info.: Three-dimensional image capture and applications III : 24-25 January 2000, San Jose, California.  pp.80-89,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3958
7.

Conference Proceedings

Conference Proceedings
Yamamoto,K. ; Yamada,K.
Pub. info.: Signal processing, sensor fusion, and target recognition VII : 13-15 April 1998, Orlando, Florida.  pp.337-346,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3374
8.

Conference Proceedings

Conference Proceedings
Yamamoto,K. ; Yamada,K. ; Kiriya,N.
Pub. info.: Ocean optics XIII : 22-25 October 1996, Halifax, Nova Scotia, Canada.  pp.815-820,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2963
9.

Conference Proceedings

Conference Proceedings
Tanida,J. ; Kumagai,T. ; Yamada,K. ; Miyatake,S. ; Ishida,K. ; Morimoto,T. ; Kondou,N. ; Miyazaki,D. ; Ichioka,Y.
Pub. info.: Optics in computing 2000 : 18-23 June 2000, Quebec city, Canada.  pp.1030-1036,  2000.  Bellingham, WA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4089
10.

Conference Proceedings

Conference Proceedings
Furuya,M. ; Kano,M. ; Terai,F. ; Aoki,K. ; Yamauchi,T. ; Yamada,K. ; Tamai,K. ; Azumano,H.
Pub. info.: Process, equipment, and materials control in integrated circuit manufacturing V : 22-23 September, 1999, Santa Clara, California.  pp.239-246,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3882