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Conference Proceedings

1. Noise Characterization of Polycrystalline Silicon Thin Film Transistors for X-ray Imagers Based on Active Pixel Architectures

L. E. Antonuk ; M. Koniczek ; J. McDonald ; Y. El-Mohri ; Q. Zhao ; M. Behravan

Pub. info.:	Amorphous and polycrystalline thin-film silicon science and technology--2008 : symposium held March 25-28, 2008, San Francisco, California, U.S.A.. pp.457-462, 2008. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	1066

Conference Proceedings

2. Large-area flat-panel amorphous silicon imagers

L.E. Antonuk ; J.M. Boudry ; Y. El-Mohri ; W. Huang ; J.H. Siewerdsen

Pub. info.:	Medical imaging 1995, Physics of medical imaging : 26-27 February 1995, San Diego, California. pp.216-227, 1995. Bellingham, WA. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2432

Conference Proceedings

3. Quantitative exploration of performance enhancements offered by active matrix x-ray imagers fabricated on plastic substrates

L. E. Antonuk ; Y. Wang ; M. Behravan ; Y. El-Mohri ; Q. Zhao ; H. Du ; A. Badano

Pub. info.:	Medical Imaging 2007: Physics of Medical Imaging. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6510

Conference Proceedings

4. Exploration of the potential performance of polycrystalline silicon-based active matrix flat panel imagers incorporating active pixel sensor architectures

L. E. Antonuk ; Y. El-Mohri ; Q. Zhao ; M. Koniczek ; J. McDonald

Pub. info.:	Medical imaging 2008. 1 pp.69130I-1-69130I-13, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6913

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