Health monitoring and smart nondestructive evaluation of structural and biological systems V : 27 February-1 March 2006, San Diego, California, USA. pp.617715-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Gunn, J. M. ; Xu, B. ; Dela Cruz J M ; Lozovoy, V. V. ; Dantus, M.
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Commercial and biomedical applications of ultrafast lasers VI : 22-25 January 2006, San Jose, California, USA. pp.61080C-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Applications of digital image processing XXVIII : 2-4 August 2005, San Diego, California, USA. pp.590901-590901, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Nonintrusive inspection, structures monitoring, and smart systems for homeland security : 27-28 February 2006, San Diego, California, USA. pp.617804-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Castracane, J. ; Xu, B. ; Gutin, O.N. ; Lavrijsen, R. ; Stollenwerk, A.
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Functional integration of opto-electro-mechanical devices and systems II : 23-24 January 2002, San Jose, USA. pp.7-15, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical data storage 2004 : 18-21 April 2004, Monterey, California, USA. pp.368-375, 2004. Bellingham. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical data storage 2004 : 18-21 April 2004, Monterey, California, USA. pp.678-685, 2004. Bellingham. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Tao, N.J. ; Li, C.Z. ; He, H.X. ; Bogozi, A. ; Xu, B. ; Lam, O.
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Scanning probe techniques for materials characterization at nanometer scale : proceedings of the International Symposium. pp.148-162, 2000. Pennington, N.J.. Electrochemical Society
Applications of digital image processing XXVI : 5-8 August 2003, San Diego, California, USA. pp.109-120, 2003. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Yuan, X. ; Wei, X. ; Wang, C. ; Qing, X. ; Deng, W. ; Xu, B. ; Jiang, D. ; Tang, J. ; Jia, H.
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ECLIM 2002 : 27th European Conference on Laser Interaction with Matter : 7-11 October 2002, Moscow, Russia. pp.621-628, 2003. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering