Low-frequency noise and radiation response of buried oxides in SOI nMOS transistors
- Author(s):
- Xiong, H.D. ( Vanderbilt Univ. (USA) )
- Fleetwood, D.M. ( Vanderbilt Univ. (USA) )
- Schwank, J.R. ( Sandia National Labs. (USA) )
- Publication title:
- Noise in Devices and Circuits
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5113
- Pub. Year:
- 2003
- Page(from):
- 44
- Page(to):
- 55
- Pages:
- 12
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819449733 [0819449733]
- Language:
- English
- Call no.:
- P63600/5113
- Type:
- Conference Proceedings
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