MIPPR 2005 : Image analysis techniques : 31 October-2 November 2005, Wuhan, China. pp.60441E-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Qi Y. ; Wang P. ; Xie J. ; Kang G. ; Zhao Y. ; Yang H.
Pub. info.:
ICO20 : optical devices and instruments : 21-26 August, 2005, Changchun, China. pp.60241F-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
MIPPR 2005 : Geospatial information, data mining, and applications : 31 October-2 November 2005, Wuhan, China. pp.60451J-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
MIPPR 2005 : Geospatial information, data mining, and applications : 31 October-2 November 2005, Wuhan, China. pp.60451O-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
MIPPR 2005 : Geospatial information, data mining, and applications : 31 October-2 November 2005, Wuhan, China. pp.60451T-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Deng J. ; Halder S. ; Hwang J. C. M. ; Hertog B. ; Xie J. ; Dabiran A. ; Osinsky A.
Pub. info.:
Infrared and photoelectronic imagers and detector devices II : 13-14 August 2006, San Diego, California, USA. pp.62940N-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering