Xiao, P. ; He, N. ; Liu, Z. ; He, Q. ; Xu, J ; Lu, Z.
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Micromachining and Microfabrication Process Technology and Devices. pp.401-405, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Liu, Z. ; He, Q ; Xiao, P. ; He, N. ; Lu, Z. ; Bo, L.
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Micromachining and Microfabrication Process Technology and Devices. pp.412-416, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Micromachining and Microfabrication Process Technology and Devices. pp.406-411, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Liao, K. J. ; Wang, W. L. ; Xiao, P. ; Yu, P. ; Wang, Y. T. ; Lu, J. W.
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Advanced sensor systems and applications II : 8-12 November 2004, Beijing, China. pp.713-718, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
APOC 2001: Asia-Pacific Optical and Wireless Communications : optical networking : 13-15 November 2001, Beijing, Chaina. pp.272-277, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Huang, S. ; Baimouratov, R. ; Xiao, P. ; Ananthasubramaniam, A. ; Nowinski, W.L.
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Medical Imaging 2004: Visualization, Image-Guided Procedures, and Display. pp.48-58, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Image and signal processing for remote sensing XII : 13-14 September 2006, Stockholm, Sweden. pp.63650F-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
He, Q. ; Liu, Z. ; Tang, J. ; Nie, L. ; Xiang, H. ; Chen, H. ; Xiao, P. ; He, N.
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Reliability, Testing, and Characterization of MEMS/MOEMS III. pp.302-309, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering