1.

Conference Proceedings
Conference Proceedings
1. Universal Correlation Between Mobility and NBTI on Advanced High-κ/Metal Gate Stacks
G. Reimbold ; X. Garros ; M. Casse ; M. Rafik ; C. Leroux
Pub. info.: Physics and technology of high-k gate dielectrics 6.  pp.41-53,  2008.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(5)
2.

Conference Proceedings
Conference Proceedings
2. Interface States in Hf-Based Stacks and their Impact on the Reliability of These Alternative Oxides
X. Garros ; G. Reimbold ; O. Louvean ; F. Martin
Pub. info.: Physics and technology of high-k gate dielectrics 4.  pp.81-96,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(3)