1.

Conference Proceedings
Conference Proceedings
1. ANGLE-RESOLVED X-RAY PHOTOELCTRON SPECTROSCOPY FOR THE CHARACTERIZATION OF GaAs (001) AND InP (001) SURFACES
Almot, P. ; Olivier, J. ; Wyczisk, F.
Pub. info.: Initial stages of epitaxial growth : symposium held April 22-24, 1987, Anaheim, California, U.S.A..  pp.231-236,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 94
2.

Conference Proceedings
Conference Proceedings
2. X-RAY PHOTOEMISSION STUDY OF SILICON NITRIDE-GaAs INTERFACES IN RELATION WITH GaAs MESFET PASSIVATION
Alnot, Patrick ; Olivier, J., ; Wyczisk, F. ; Peray, J. F. ; Joubart, R.
Pub. info.: Plasma processing and synthesis of materials : symposium held April 21-23, 1987, Anaheim, California, U.S.A..  pp.279-284,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 98
3.

Conference Proceedings
Conference Proceedings
3. Thermal Annealing Effect on TiN/Ti Layers on 4H-SiC: Metal-Semiconductor Interface Characterization
Defives, D. ; Durand, O. ; Wyczisk, F. ; Olivier, J. ; Noblanc, O. ; Brylinski, C.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.411-414,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)