1.

Conference Proceedings
Conference Proceedings
1. Aluminum and Electron-Irradiation-Induced Deep Levels in n-Type and p-Type 6H-SiC
Gong, M. ; Beling, C. D. ; Fung, S. ; Brauer, G. ; Wirth, H. ; Skorupa, W. ; You, Z-P.
Pub. info.: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.455-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 510
2.

Conference Proceedings
Conference Proceedings
2. High Concentration Doping of 6H-SiC by Ion Implantation: Flash versus Furnace Annealing
Panknin, D. ; Wirth, H. ; Anwand, W. ; Brauer, G. ; Skorupa, W.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.877-880,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(2)