1.

Conference Proceedings

Conference Proceedings
Catanzaro,B.E. ; Connell,S.J. ; Mimovich,M. ; Backovsky,S. ; Williams,G. ; Thomas,J.A. ; Barber,D.D. ; Johnston,R.A. ; Hylton,J.C. ; Dodson,K.J. ; Cohen,E.J.
Pub. info.: Optomechanical design and engineering 2001 : 2-3 August 2001, San Diego, USA.  pp.238-255,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4444
2.

Conference Proceedings

Conference Proceedings
Anderson,J.S. ; Kostrzewa,T. ; Cook,L.G. ; Baker,G. ; Radford,W.A. ; Jack,M.D. ; Finch,A. ; Kennedy,A. ; Kojiro,J.K. ; Murphy,D.F. ; Ray,M. ; Wyles,R. ; Lohrmann,D. ; Williams,G. ; Janesick,J. ; Dosluoglu,T. ; Reinheimer,A.
Pub. info.: Infrared technology and applications XXVII : 16-20 April 2001, Orlando, USA.  pp.14-24,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4369
3.

Conference Proceedings

Conference Proceedings
Williams,G. ; Stytz,M.R. ; Banks,S.B.
Pub. info.: Modeling, simulation, and visualization of sensory response for defense applications : 22-23 April 1997, Orlando, Florida.  pp.150-161,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3085
4.

Conference Proceedings

Conference Proceedings
Massalska-Arodz,M. ; Smith,I.K. ; Williams,G. ; Aldridge,G.A. ; Dabrowski,R.
Pub. info.: Liquid crystals : physics, technology, and applications : 3-8 March 1997, Zakopane, Poland.  pp.249-252,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3318
5.

Conference Proceedings

Conference Proceedings
Yin,X. ; Wong,A.K. ; Wheeler,D.C. ; Williams,G. ; Lehner,E.A. ; Zach,F.X. ; Kim,B.Y. ; Fukuzaki,Y. ; Lu,Z.G. ; Credendino,S. ; Wiltshire,T.J.
Pub. info.: Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California.  pp.449-459,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3998
6.

Conference Proceedings

Conference Proceedings
Biswas,A. ; Williams,G. ; Wilson,K.E. ; Hakakha,H. ; Stieger,R. ; Korevaar,E.J.
Pub. info.: Free-space laser communication technologies X : 27-28 January 1998, San Jose, California.  pp.2-13,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3266
7.

Technical Paper

Technical Paper
Nalepka,J. ; Williams,G. ; Dube,T. ; Bryant,R. ; Danube,T.
Pub. info.: A collection of technical papers : AIAA Modeling and Simulation Technologies Conference, Montreal, Canada, 6-9 August 2001.  pp.189-196,  2001.  Reston, VA.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Modeling and Simulation Technologies Conference
Ser. no.: 2001
8.

Conference Proceedings

Conference Proceedings
Wu,Q. ; Lu,Z.G. ; Williams,G. ; Zach,F.X. ; Liegl,B.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XV.  pp.234-244,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4344