1.

Conference Proceedings

Conference Proceedings
Willander,M. ; Fu,Y.
Pub. info.: Physics of - Semiconductor Devices -.  Part 2  pp.986-993,  1998.  New Delhi.  Narosa Publishing House
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3316
2.

Conference Proceedings

Conference Proceedings
Golubev,D. ; Kuzmin,L.S. ; Willander,M.
Pub. info.: Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California.  pp.364-370,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3629
3.

Conference Proceedings

Conference Proceedings
Lu,W. ; Liu,X. ; Chen,X. ; Shi,G.L. ; Qiao,Y.M. ; Shen,S.C. ; Fu,Y. ; Willander,M.
Pub. info.: Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California.  pp.409-414,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3629
4.

Conference Proceedings

Conference Proceedings
Lu,W. ; Li,N. ; Zhang,L.F. ; Shen,S.C. ; Fu,Y. ; Willander,M. ; Fu,L. ; Tan,H.H. ; Jagadish,C.
Pub. info.: Infrared technology and applications XXVI : 30 July - 3 August 2000, San Diego, USA.  pp.348-352,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4130
5.

Conference Proceedings

Conference Proceedings
Li,Z.-F. ; Lu,W. ; Liu,X. ; Shen,S.C. ; Fu,Y. ; Willander,M. ; Tan,H.H. ; Jagadish,C.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.195-198,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
6.

Conference Proceedings

Conference Proceedings
Ryzhii,V. ; Khmyrova,I. ; Ryzhii,M. ; Pipa,V.I. ; Mitin,V.V. ; Willander,M.
Pub. info.: Photodetectors : materials and devices VI : 22-24 January 2001, San Jose, USA.  pp.396-403,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4288
7.

Conference Proceedings

Conference Proceedings
Fu,Y. ; Willander,M. ; Dutta,A. ; Oda,S.
Pub. info.: Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999).  Part2  pp.1027-1032,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3975
8.

Conference Proceedings

Conference Proceedings
Jain,S.C. ; Geens,W. ; Poortmans,J. ; Heremans,P. ; Nijs,J. ; Mertens,R. ; Willander,M.
Pub. info.: Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999).  Part2  pp.1099-1106,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3975
9.

Conference Proceedings

Conference Proceedings
Willander,M. ; Fu,Y. ; Nilsson,O.
Pub. info.: Ultrafast phenomena in semiconductors : proceedings of the 10th International Symposium on Ultrafast Phenomena in Semiconductors (10-UFPS), held in Vilnius, Lithuania, August/September, 1998.  pp.3-10,  1999.  Zurich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 297-298
10.

Conference Proceedings

Conference Proceedings
Fu,Y. ; Willander,M. ; Lu,W. ; Xu,W.L. ; Li,N. ; Shen,S.C.
Pub. info.: Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California.  pp.114-120,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3629