Blank Cover Image

TRANSMISSION ELECTRON MICROSCOPY STUDIES OF SILICON NITRIDE/SILICON CARBIDE INTERFACES

Author(s):
Publication title:
Interfaces in composites : symposium held November 27-29, 1989, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
170
Pub. Year:
1990
Page(from):
79
Page(to):
84
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990586 [1558990585]
Language:
English
Call no.:
M23500/170
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings ANALYTICAL ELECTRON MICROSCOPY AND HIGH-RESOLUTION ELECTRON MICROSCOPY STUDIES OF GRAIN-BOUNDARY FILMS IN SILICON NITRIDE-BASED CERAMICS

Kleebe, H. -J., Ruhle, M.

Materials Research Society
7 Conference Proceedings Electron Microscopy Studies of the High-Temperature Oxidation Behavior of NiAl

Yang, J. C., Schumann, E., Levin, I., Muellejans, H., Ruhle, M.

MRS - Materials Research Society
2 Conference Proceedings *HIGHRESOLUTION ELECTRON MICROSCOPY OBSERVATIONS OF GRAIN-BOUNDARY FILMS IN SILICON NITRIDE CERAMICS

Kleebe, H.-J., Cinibulk, M.K., Tanaka, I., Bruley, J., Cannon, R.M., Clarke, D.R., Hoffmann, M.J., Ruhle, M.

Materials Research Society
8 Conference Proceedings Transmission Electron Microscopy Studies of GaAs/ Ge Interfaces

Kishore, R., Sood, K.N., Singh, Sukhvir, Sharma, S.K., Tyagi, R., Singh, M., Agarwal, S.K.

SPIE-The International Society for Optical Engineering
3 Conference Proceedings High Resolution Electron Microsopy Studies on sillicon Nitride Ceramics

Kleebe -J. H., Cinibulk K. M., Tanaka I., Bruley J., Vetrono S. J., Ruhle M.

Kluwer Academic Publishers
9 Conference Proceedings Compositions and Thicknesses of Grain Boundary Films in Ca - Doped Sillicon Nitride Ceramics

Tanaka I,, Bruley J., Gu H., Hoffmann J. M., Kleebe -J. H., Cannon M. R., Clarke R. D., Ruhle M.

Kluwer Academic Publishers
4 Conference Proceedings QUANTITATIVE HIGH-RESOLUTION ELECTRON MICROSCOPY OF GRAIN BOUNDARIES IN α-Al2O3

Hoche, T., Kenway, P.R., Kleebe, H.-J., Ruhle, M.

Materials Research Society
10 Conference Proceedings CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPY OF DEFECTS IN BETA SILICON CARBIDE THIN FILMS

Carter Jr., C. H., Edmond, J. A., Palmour, J. W., Ryu, J., Kim, H. J., Davis, R. F.

Materials Research Society
5 Conference Proceedings HIGH RESOLUTION AND ANALYTICAL ELECTRON MICROSCOPY OF MULTILAYER HETEROEPITAXIAL SEMICONDUCTORS

Kleebe, H.-J., Hamilton, W.J., Ahlgren, W.L., Johnson, S.M., Ruhle, M.

Materials Research Society
11 Conference Proceedings Transmission electron microscopy studies of the polycrystalline silison-SiO2 interface

Bravman, J. C., Sinclair, R.

North-Holland
6 Conference Proceedings HIGH RESOLUTION ELECTRON MICROSCOPY STUDIES OF INTERFACES BETWEEN Al2O3 SUBSTRATES AND MBE GROWN Nb FILMS

Mayer, J., Dura, J., Flynn, C.P., Ruhle, M.

Materials Research Society
12 Conference Proceedings Atomistic Structure of Internal Interfaces by High Resolution Electron Microscopy

Ruhle Manfred

Plenum Press
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12