1.

Conference Proceedings

Conference Proceedings
Wilkening,W. ; Kaufmann,U. ; Schneider,J. ; Schonherr,E. ; Glaser,E.R. ; Shanabrook,B.V. ; Waterman,J.R. ; Wagner,R.J.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.793-798,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
2.

Conference Proceedings

Conference Proceedings
Hahn,W.-S. ; Clerjaud,B. ; Cote,D. ; Gendron,F. ; Porte,C. ; Ulrici,W. ; Wasik,D. ; Wilkening,W.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.277-282,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings

Conference Proceedings
Clajaud,B. ; Gendron,F. ; Porte,C. ; Wilkening,W.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.837-842,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201