1.

Conference Proceedings

Conference Proceedings
Koschnick,F.K. ; Spaeth,J.-M. ; Glaser,E.R. ; Doverspike,K. ; Rowland,L.B. ; Gaskill,D.K. ; Wickenden,D.K.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.37-42,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings

Conference Proceedings
Wickenden,D.K. ; Champion,J.L. ; Givens,R.B. ; Kistenmacher,T.J. ; Lamb,J.L. ; Oslander,R.
Pub. info.: Micromachined Devices and Components V.  pp.267-273,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3876
3.

Conference Proceedings

Conference Proceedings
Wickenden,D.K. ; Givens,R.B. ; Osiander,R. ; Champion,J.L. ; Oursler,O.A. ; Kistenmacher,T.J.
Pub. info.: Micromachined Devices and Components IV.  pp.350-358,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3514