1.
Conference Proceedings
Koschnick,F.K. ; Spaeth,J.-M. ; Glaser,E.R. ; Doverspike,K. ; Rowland,L.B. ; Gaskill,D.K. ; Wickenden,D.K.
Pub. info.:
Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995 . pp.37-42, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:
Materials science forum
Ser. no.:
196-201
2.
Conference Proceedings
Wickenden,D.K. ; Champion,J.L. ; Givens,R.B. ; Kistenmacher,T.J. ; Lamb,J.L. ; Oslander,R.
Pub. info.:
Micromachined Devices and Components V . pp.267-273, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3876
3.
Conference Proceedings
Wickenden,D.K. ; Givens,R.B. ; Osiander,R. ; Champion,J.L. ; Oursler,O.A. ; Kistenmacher,T.J.
Pub. info.:
Micromachined Devices and Components IV . pp.350-358, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3514