1.

Conference Proceedings
Conference Proceedings
1. Dopant-Defect Interactions in II-VI Semiconductors Studied by PAC
Wichert, Thomas
Pub. info.: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.237-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 378
2.

Conference Proceedings
Conference Proceedings
2. *CHARACTERIZATION OF DEFECT STRUCTURES BY PERTURBED ANGULAR CORRELATION TECHNIQUE
Wichert, Thomas
Pub. info.: Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A..  pp.35-52,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 82