1.

Conference Proceedings

Conference Proceedings
Wei, Wei ; Xiong, Gang ; Sun, Y.-M. ; Joly, Alan G. ; Beck, Kenneth M. ; White, J.M. ; Hess, Wayne P.
Pub. info.: Materials, technology and reliability of low-k dielectrics and copper interconnects : symposium held April 18-21, 2006, San Francisco, California, U.S.A..  pp.185-190,  2006.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 914
2.

Conference Proceedings

Conference Proceedings
Gekelman, D. ; White, J.M.
Pub. info.: Lasers in dentistry VIII : 21-22 January 2002, San Jose, USA.  pp.31-38,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4610
3.

Conference Proceedings

Conference Proceedings
White, J.M. ; Gekelman, D. ; Shin, K.-B. ; Park, J.-S. ; Swenson, T.O. ; Rouse, B.P. ; Tran, K.T. ; Bullard, S. L. ; Scott-Beckles, L.B. ; Oto, M.G. ; Buhler, J.S. ; Yamamoto, A.
Pub. info.: Lasers in dentistry VIII : 21-22 January 2002, San Jose, USA.  pp.39-48,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4610
4.

Conference Proceedings

Conference Proceedings
Akhter, S. ; Jo, S.K. ; Zhou, X.-L. ; White, J.M.
Pub. info.: Electronic packaging materials science IV : symposium held April 24-28, 1989, San Diego, California, U.S.A..  pp.241-246,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 154
5.

Conference Proceedings

Conference Proceedings
Kwong, D.L. ; Ku, Y.H. ; Lee, S.K. ; Alvi, N.S. ; Chu, P. ; Zhou, Y. ; White, J.M.
Pub. info.: Materials issues in silicon integrated circuit processing : symposium held April 15-18, 1986, Palo Alto, California, U.S.A..  pp.379-386,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 71
6.

Conference Proceedings

Conference Proceedings
Sun, Y.-M. ; Lozano, J. ; Endle, J. ; Ekerdt, J. ; White, J.M. ; Hance, R.L.
Pub. info.: Proceedings of the Symposium on Fundamental Gas-phase and Surface Chemistry of Vapor-phase Materials Synthesis.  pp.400-406,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-23
7.

Conference Proceedings

Conference Proceedings
Tsai, C. ; Li, K.-H. ; Sarathy, J. ; Jung, K. ; Shth, S. ; Hance, B.K. ; White, J.M. ; Kwong, D.-L. ; Sharps, P.R. ; Timmons, M.L. ; Venkatasubramanian, R. ; Hutchby, J.A. ; Campbell, J.C.
Pub. info.: Light emission from silicon : symposium held December 3-5, 1991, Boston, Massachusetts, U.S.A..  pp.203-208,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 256
8.

Conference Proceedings

Conference Proceedings
Sun, Y.-M. ; Lee, S.Y. ; Engbrecht, E.R. ; Pfeifer, K. ; Smith, S. ; White, J.M. ; Ekerdt, J.G.
Pub. info.: Growth, evolution and properties of surfaces, thin films and self-organized structures : symposium held November 27-December 1, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 648
9.

Conference Proceedings

Conference Proceedings
Sun, Y.-M. ; Eklund, J. ; Wang, Q. ; Gay, D. ; White, J.M.
Pub. info.: Surface engineering 2002 - synthesis, characterization and applications : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.481-488,  2003.  Warrendale, Penn.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 750
10.

Conference Proceedings

Conference Proceedings
Gekelman, D. ; Yamamoto, A. ; Oto, M.G. ; White, J.M.
Pub. info.: Lasers in Dentistry IX.  pp.18-29,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4950