1.

Conference Proceedings

Conference Proceedings
Axelrad, V. ; Shibkov, A. ; Hill, G. ; Lin, H. -J. ; Tabery, C. ; White, D. ; Boksha, V. ; Thilmany, R.
Pub. info.: Design and process integration for microelectronic manufacturing III : 3-4 March 2005, San Jose, California, USA.  pp.419-426,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5756
2.

Conference Proceedings

Conference Proceedings
Collins, D.J. ; Strojwas, A.J. ; White, D.
Pub. info.: Proceedings of the Third International Symposium on Process Physics and Modeling in Semiconductor Technology.  pp.592-604,  1993.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1993-6
3.

Conference Proceedings

Conference Proceedings
Guha, S. ; Koppikar, S. ; White, D. ; Zutshi, A.
Pub. info.: Chemical mechanical planariarization in IC device manufacturing III : proceedings of the international symposium.  pp.423-433,  1999.  Pennington, N. J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-37
4.

Conference Proceedings

Conference Proceedings
Parrillo, D. J. ; Biaglow, A. ; Gorte, R. J. ; White, D.
Pub. info.: Zeolites and related microporous materials : state of the art 1994 : proceedings of the 10th International Zeolite Conference, Garmisch-Partenkirchen, Germany, July 17-22, 1994.  A  pp.701-,  1994.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 84
5.

Conference Proceedings

Conference Proceedings
Gookassian, J. ; Pack, B. ; Heins, M. ; Garcia, J. ; Divecha, H. ; Gordon, B. ; Frazier, D. ; White, D. ; Lachinyan, G. ; Dillon, B. ; Suzor, C. ; Adamov, A. ; Min, K. -Y. ; Bakarian, S. ; Marutyan, R. ; Boksha, V.
Pub. info.: Design and process integration for microelectronic manufacturing III : 3-4 March 2005, San Jose, California, USA.  pp.208-218,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5756
6.

Conference Proceedings

Conference Proceedings
Wei, G. ; Miranda, J. ; Sue, H. -J. ; Burton, B. ; White, D.
Pub. info.: Conference proceedings at ANTEC '98 : plastics on my mind, Society of Plastics Engineers, Atlanta, Georgia, April 26-April 30, 1998.  3  pp.1458-1462,  1998.  Brookfield Center, CT.  Society of Plastics Engineers, Inc. (SPE)
Title of ser.: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.: 44(3)
7.

Conference Proceedings

Conference Proceedings
Gradziel, M. L. ; White, D. ; Trappe, N. ; Mahon, R. J. ; Finn, T. J. ; Withington, S. ; Murphy, A. ; O'Sullivan, C. M.
Pub. info.: Passive millimetre-wave and terahertz imaging and technology : 27-28 October 2004, London, United Kingdom.  pp.154-165,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5619
8.

Conference Proceedings

Conference Proceedings
Gricus-Kofke, T.J. ; Aronson, M.T. ; Gorte, R.J. ; White, D. ; Farneth, W.E. ; Dupont de Nemours, E.I.
Pub. info.: AIChE ANNUAL MEETING, NEW YORK, NY - NOVEMBER 15-20, 1987.  1987.  New York.  American Institute of Chemical Engineers
Title of ser.: AIChE meeting [papers]
Ser. no.: 1987
9.

Conference Proceedings

Conference Proceedings
O'Sullivan, C. ; Murphy, J. A. ; Cahill, G. ; Gradziel, M. L. ; Trappe, N. ; White, D. ; Yurchenko, V. ; Withington, S. ; Jellema, W.
Pub. info.: Millimeter and submillimeter detectors for astronomy II : 23-25 June 2004, Glasgow, Scotland, United Kingdom.  pp.320-331,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5498
10.

Conference Proceedings

Conference Proceedings
Barna, G.G. ; Buck, D.W. ; Butler, S.W. ; Splichal, M. ; Anderson, H. ; White, D.
Pub. info.: Proceedings of the Symposium on Process control, Diagnostics, and Modeling in Semiconductor Manufacturing.  pp.306-326,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-2