1.

Conference Proceedings
Conference Proceedings
1. Field Emission Display Development at Motorola
Talin, A.A ; Coll, B.F. ; Wei, Yi ; Dean, K.A. ; Jaskie, J.E.
Pub. info.: Cold cathodes : proceedings of the first International Symposium.  pp.247-262,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-28
2.

Conference Proceedings
Conference Proceedings
2. Device reliability issues in field emission displays
Chalamala, Babu R. ; Reuss, Robert H. ; Trottier, Troy A. ; Penn, Cecil W. ; Wei, Yi
Pub. info.: Cockpit displays V : displays for defense applications : 15-17 April, 1998, Orlando, Florida.  pp.236-243,  1998.  Bellingham, Washington.  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3363
3.

Conference Proceedings
Conference Proceedings
3. Growth and Characterization of Self Assembled Palladium Oxide Nanostructures
Chalamala, Babu R. ; Reuss, Robert H. ; Wei, Yi ; Aggarwal, Sanjeev ; Ramesh, R.
Pub. info.: Transport and microstructural phenomena in oxide electronics : symposium held April 16-20, 2001, San Francisco, California, U.S.A..  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 666
4.

Conference Proceedings
Conference Proceedings
4. Si(100) Surface Cleaning Using Sr And SrO
Wei, Yi ; Hu, Xiaoming ; Liang, Yong ; Jordan, D.C. ; Craigo, Brad ; Droopad, Ravi ; Yu, Z. ; Demkov, Alex ; Edwards, John L. Jr., ; Moore, Karen ; Ooms, William J.
Pub. info.: Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.139-144,  2002.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 716
5.

Conference Proceedings
Conference Proceedings
5. Sr/Si Template Formation For The Epitaxial Growth of SrTiO3 On Silicon
Hu, Xiaoming ; Liang, Y. ; Wei, Yi ; Edwards, J.L. Jr., ; Droopad, R. ; Moore, K. ; Ooms, W.J.
Pub. info.: Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.261-266,  2002.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 716